BibTeX
@inproceedings{DBLP:conf/vlsid/SrinivasJA95,
author = {Mandyam-Komar Srinivas and
James Jacob and
Vishwani D. Agrawal},
title = {Functional test generation for non-scan sequential circuits},
booktitle = {VLSI Design},
year = {1995},
pages = {47-52},
ee = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512076},
crossref = {DBLP:conf/vlsid/1995},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/vlsid/1995,
title = {8th International Conference on VLSI Design (VLSI Design
1995), 4-7 January 1995, New Delhi, India},
booktitle = {VLSI Design},
publisher = {IEEE Computer Society},
year = {1995},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2005-02-25 by Michael Ley (ley@uni-trier.de)