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BibTeX record conf/vlsid/RaiolaER017
@inproceedings{DBLP:conf/vlsid/RaiolaER017, author = {Pascal Raiola and Dominik Erb and Sudhakar M. Reddy and Bernd Becker}, title = {Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model}, booktitle = {30th International Conference on {VLSI} Design and 16th International Conference on Embedded Systems, {VLSID} 2017, Hyderabad, India, January 7-11, 2017}, pages = {135--140}, publisher = {{IEEE} Computer Society}, year = {2017}, url = {https://doi.org/10.1109/VLSID.2017.34}, doi = {10.1109/VLSID.2017.34}, timestamp = {Fri, 24 Mar 2023 00:04:00 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/RaiolaER017.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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