ABCD Modeling of Crosstalk Coupling Noise to Analyze the Signal Integrity Losses on the Victim Interconnect in DSM Chips.

Ajoy Kumar Palit Volker Meyer Walter Anheier Jürgen Schlöffel ABCD Modeling of Crosstalk Coupling Noise to Analyze the Signal Integrity Losses on the Victim Interconnect in DSM Chips. 354-359 2005 conf/vlsid/2005 VLSI Design http://csdl.computer.org/comp/proceedings/vlsid/2005/2264/00/22640354abs.htm db/conf/vlsid/vlsid2005.html#PalitMAS05