Nilanjan Mukherjee Janusz Rajski Jerzy Tyszer Defect Aware to Power Conscious Tests - The New DFT Landscape. 23-25 2009 VLSI Design http://dx.doi.org/10.1109/VLSI.Design.2009.111 conf/vlsid/2009 db/conf/vlsid/vlsid2009.html#MukherjeeRT09