BibTeX record conf/vlsid/MayerS00

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@inproceedings{DBLP:conf/vlsid/MayerS00,
  author       = {Frank Mayer and
                  Albrecht P. Stroele},
  title        = {A Versatile {BIST} Technique Combining Test Registers and Accumulators},
  booktitle    = {13th International Conference on {VLSI} Design {(VLSI} Design 2000),
                  4-7 January 2000, Calcutta, India},
  pages        = {412},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ICVD.2000.812642},
  doi          = {10.1109/ICVD.2000.812642},
  timestamp    = {Fri, 24 Mar 2023 00:04:01 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/MayerS00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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