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BibTeX record conf/vlsid/MajhiJPA95
@inproceedings{DBLP:conf/vlsid/MajhiJPA95, author = {Ananta K. Majhi and James Jacob and Lalit M. Patnaik and Vishwani D. Agrawal}, title = {An efficient automatic test generation system for path delay faults in combinational circuits}, booktitle = {8th International Conference on {VLSI} Design {(VLSI} Design 1995), 4-7 January 1995, New Delhi, India}, pages = {161--165}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/ICVD.1995.512097}, doi = {10.1109/ICVD.1995.512097}, timestamp = {Fri, 24 Mar 2023 00:04:01 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/MajhiJPA95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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