Loganathan Lingappan Vijay Gangaram Niraj K. Jha Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits. 504-512 2007 conf/vlsid/2007 VLSI Design http://doi.ieeecomputersociety.org/10.1109/VLSID.2007.82 db/conf/vlsid/vlsid2007.html#LingappanGJ07