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BibTeX record conf/vlsid/JoneD93
@inproceedings{DBLP:conf/vlsid/JoneD93, author = {Wen{-}Ben Jone and Sunil R. Das}, title = {{CACOP} - {A} Random Pattern Testability Analyzer}, booktitle = {Proceedings of the Sixth International Conference on {VLSI} Design, {VLSI} Design 1993, Bombay, India, January 3-6, 1993}, pages = {61--64}, publisher = {{IEEE} Computer Society}, year = {1993}, url = {https://doi.org/10.1109/ICVD.1993.669639}, doi = {10.1109/ICVD.1993.669639}, timestamp = {Fri, 24 Mar 2023 00:04:00 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/JoneD93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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