![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record conf/vlsid/HengsterDB94
@inproceedings{DBLP:conf/vlsid/HengsterDB94, author = {Harry Hengster and Rolf Drechsler and Bernd Becker}, title = {Testability Properties of Local Circuit Transformations with Respect to the Robust Path-Delay-Fault Model}, booktitle = {Proceedings of the Seventh International Conference on {VLSI} Design, {VLSI} Design 1994, Calcutta, India, January 5-8, 1994}, pages = {123--126}, publisher = {{IEEE} Computer Society}, year = {1994}, url = {https://doi.org/10.1109/ICVD.1994.282669}, doi = {10.1109/ICVD.1994.282669}, timestamp = {Fri, 24 Mar 2023 00:03:59 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/HengsterDB94.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.