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BibTeX record conf/vlsid/GuptaBP15
@inproceedings{DBLP:conf/vlsid/GuptaBP15, author = {Radhika Gupta and Atul Bhargava and Rakeshshenoy Panemangalore}, title = {Block-Level Electro-Migration Analysis {(BEMA)} for Safer Product Life}, booktitle = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore, India, January 3-7, 2015}, pages = {276--281}, publisher = {{IEEE} Computer Society}, year = {2015}, url = {https://doi.org/10.1109/VLSID.2015.53}, doi = {10.1109/VLSID.2015.53}, timestamp = {Sat, 30 Sep 2023 09:58:22 +0200}, biburl = {https://dblp.org/rec/conf/vlsid/GuptaBP15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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