![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record conf/vlsid/GoelM05
@inproceedings{DBLP:conf/vlsid/GoelM05, author = {Ankur Goel and Baquer Mazhari}, title = {Gate Leakage and Its Reduction in Deep Submicron {SRAM}}, booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India}, pages = {606--611}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ICVD.2005.103}, doi = {10.1109/ICVD.2005.103}, timestamp = {Fri, 24 Mar 2023 00:04:01 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/GoelM05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.