![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record conf/vlsid/DasCB98
@inproceedings{DBLP:conf/vlsid/DasCB98, author = {Debesh K. Das and Indrajit Chaudhuri and Bhargab B. Bhattacharya}, title = {Design of an Optimal Test Pattern Generator for Built-in Self Testing of Path Delay Faults}, booktitle = {11th International Conference on {VLSI} Design {(VLSI} Design 1991), 4-7 January 1998, Chennai, India}, pages = {205}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.org/10.1109/ICVD.1998.646603}, doi = {10.1109/ICVD.1998.646603}, timestamp = {Fri, 24 Mar 2023 00:03:59 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/DasCB98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.