BibTeX record conf/vlsid/DasCB97

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@inproceedings{DBLP:conf/vlsid/DasCB97,
  author       = {Debesh Kumar Das and
                  Susanta Chakraborty and
                  Bhargab B. Bhattacharya},
  title        = {New {BIST} Techniques for Universal and Robust Testing of {CMOS} Stuck-Open
                  Faults},
  booktitle    = {10th International Conference on {VLSI} Design {(VLSI} Design 1997),
                  4-7 January 1997, Hyderabad, India},
  pages        = {303--309},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/ICVD.1997.568094},
  doi          = {10.1109/ICVD.1997.568094},
  timestamp    = {Fri, 24 Mar 2023 00:03:59 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/DasCB97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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