BibTeX record conf/vlsid/ChowdhuryGSA19

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@inproceedings{DBLP:conf/vlsid/ChowdhuryGSA19,
  author       = {Prattay Chowdhury and
                  Ujjwal Guin and
                  Adit D. Singh and
                  Vishwani D. Agrawal},
  title        = {Two-Pattern {\unicode{8710}}IDDQ Test for Recycled {IC} Detection},
  booktitle    = {32nd International Conference on {VLSI} Design and 18th International
                  Conference on Embedded Systems, {VLSID} 2019, Delhi, India, January
                  5-9, 2019},
  pages        = {82--87},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/VLSID.2019.00033},
  doi          = {10.1109/VLSID.2019.00033},
  timestamp    = {Mon, 14 Nov 2022 15:28:07 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/ChowdhuryGSA19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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