BibTeX record conf/vlsid/ChatterjeeKPM05

• > Home > conf/vlsid/ChatterjeeKPM05

@inproceedings{DBLP:conf/vlsid/ChatterjeeKPM05,
  author       = {Abhijit Chatterjee and
                  Ali Keshavarzi and
                  Amit Patra and
                  Siddhartha Mukhopadhyay},
  title        = {Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal,
                  and {RF}},
  booktitle    = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
                  with the 4th International Conference on Embedded Systems Design,
                  3-7 January 2005, Kolkata, India},
  pages        = {12--13},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ICVD.2005.161},
  doi          = {10.1109/ICVD.2005.161},
  timestamp    = {Fri, 24 Mar 2023 00:04:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/ChatterjeeKPM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}