Savita Banerjee Srimat T. Chakradhar Rabindra K. Roy Synchronous Test Generation Model for Asynchronous Circuits. 178-185 1996 conf/vlsid/1996 VLSI Design http://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489481 db/conf/vlsid/vlsid1996.html#BanerjeeCR96