BibTeX record conf/vlsid/AainBD95

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@inproceedings{DBLP:conf/vlsid/AainBD95,
  author       = {Abu Khari bin A'Ain and
                  A. H. Bratt and
                  A. P. Dorey},
  title        = {Exposing floating gate defects in analogue {CMOS} circuits by power
                  supply voltage control testing technique},
  booktitle    = {8th International Conference on {VLSI} Design {(VLSI} Design 1995),
                  4-7 January 1995, New Delhi, India},
  pages        = {239--242},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/ICVD.1995.512116},
  doi          = {10.1109/ICVD.1995.512116},
  timestamp    = {Fri, 24 Mar 2023 00:04:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/AainBD95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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