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BibTeX record conf/vlsic/YabuuchiMTT20
@inproceedings{DBLP:conf/vlsic/YabuuchiMTT20, author = {Makoto Yabuuchi and Masao Morimoto and Yasumasa Tsukamoto and Shinji Tanaka}, title = {A 7nm Fin-FET 4.04-Mb/mm2 {TCAM} with Improved Electromigration Reliability Using Far-Side Driving Scheme and Self-Adjust Reference Match-Line Amplifier}, booktitle = {{IEEE} Symposium on {VLSI} Circuits, {VLSI} Circuits 2020, Honolulu, HI, USA, June 16-19, 2020}, pages = {1--2}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VLSICircuits18222.2020.9162775}, doi = {10.1109/VLSICIRCUITS18222.2020.9162775}, timestamp = {Mon, 24 Aug 2020 16:22:01 +0200}, biburl = {https://dblp.org/rec/conf/vlsic/YabuuchiMTT20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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