BibTeX record conf/vlsic/HsiehCCCC19

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@inproceedings{DBLP:conf/vlsic/HsiehCCCC19,
  author       = {E. R. Hsieh and
                  C. W. Chang and
                  C. C. Chuang and
                  H. W. Chen and
                  Steve S. Chung},
  title        = {The Demonstration of Gate Dielectric-fuse 4kb {OTP} Memory Feasible
                  for Embedded Applications in High-k Metal-gate {CMOS} Generations
                  and Beyond},
  booktitle    = {2019 Symposium on {VLSI} Circuits, Kyoto, Japan, June 9-14, 2019},
  pages        = {208},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/VLSIC.2019.8778094},
  doi          = {10.23919/VLSIC.2019.8778094},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsic/HsiehCCCC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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