A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on a-priori Functional Fault- Tolerance Analysis.

Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on a-priori Functional Fault- Tolerance Analysis. 111-125 2005 conf/vlsi/2005soc VLSI-SoC http://dx.doi.org/10.1007/978-0-387-73661-7_8 db/conf/vlsi/vlsisoc2005.html#StanisavljevicSL05