Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design.

Antonis Papanikolaou Miguel Miranda Hua Wang Francky Catthoor M. Satyakiran Pol Marchal Ben Kaczer C. Bruynseraede Zsolt Tokei Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. 342-347 2006 conf/vlsi/2006soc VLSI-SoC http://dx.doi.org/10.1109/VLSISOC.2006.313258 db/conf/vlsi/vlsisoc2006.html#PapanikolaouMWCSMKBT06