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BibTeX record conf/vlsi/LiouHCC15
@inproceedings{DBLP:conf/vlsi/LiouHCC15, author = {Jing{-}Jia Liou and Meng{-}Ta Hsieh and Jun{-}Fei Cherng and Harry H. Chen}, title = {Cost reduction of system-level tests with stressed structural tests and {SVM}}, booktitle = {2015 {IFIP/IEEE} International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015}, pages = {177--182}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/VLSI-SoC.2015.7314412}, doi = {10.1109/VLSI-SOC.2015.7314412}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/vlsi/LiouHCC15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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