Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint.

Erik Larsson Stina Edbom Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. 221-244 2005 conf/vlsi/2005soc VLSI-SoC http://dx.doi.org/10.1007/978-0-387-73661-7_15 db/conf/vlsi/vlsisoc2005.html#LarssonE05