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BibTeX record conf/vlsi-dat/ZhuL012
@inproceedings{DBLP:conf/vlsi-dat/ZhuL012, author = {Xuefeng Zhu and Huawei Li and Xiaowei Li}, title = {Statistical {SDFC:} {A} metric for evaluating test quality of small delay faults}, booktitle = {Proceedings of Technical Program of 2012 {VLSI} Design, Automation and Test, {VLSI-DAT} 2012, Hsinchu, Taiwan, April 23-25, 2012}, pages = {1--4}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/VLSI-DAT.2012.6212623}, doi = {10.1109/VLSI-DAT.2012.6212623}, timestamp = {Thu, 11 May 2023 13:50:00 +0200}, biburl = {https://dblp.org/rec/conf/vlsi-dat/ZhuL012.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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