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BibTeX record conf/vlsi-dat/WangLHWW12
@inproceedings{DBLP:conf/vlsi-dat/WangLHWW12, author = {Chih{-}Wea Wang and Chen{-}Tung Lin and Chun{-}Chieh Hsu and Ching{-}Tung Wu and Chi{-}Feng Wu}, title = {Test for more than pass/fail using on-chip temperature sensor}, booktitle = {Proceedings of Technical Program of 2012 {VLSI} Design, Automation and Test, {VLSI-DAT} 2012, Hsinchu, Taiwan, April 23-25, 2012}, pages = {1--4}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/VLSI-DAT.2012.6212639}, doi = {10.1109/VLSI-DAT.2012.6212639}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/vlsi-dat/WangLHWW12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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