BibTeX record conf/vlsi-dat/VenkatacharRCBP17

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@inproceedings{DBLP:conf/vlsi-dat/VenkatacharRCBP17,
  author       = {Arun Venkatachar and
                  S. Rajakumar and
                  M. Chapman and
                  Sajeewan Basuru and
                  Ganapathy Parthasarathy and
                  C.{-}C. Lin and
                  A. Hegde and
                  T. Li},
  title        = {Test Knowledge Data Base},
  booktitle    = {2017 International Symposium on {VLSI} Design, Automation and Test,
                  {VLSI-DAT} 2017, Hsinchu, Taiwan, April 24-27, 2017},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/VLSI-DAT.2017.7939654},
  doi          = {10.1109/VLSI-DAT.2017.7939654},
  timestamp    = {Wed, 03 Nov 2021 08:29:52 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsi-dat/VenkatacharRCBP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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