BibTeX record conf/vlsi-dat/TsaiKLC13

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@inproceedings{DBLP:conf/vlsi-dat/TsaiKLC13,
  author       = {Hui{-}Wen Tsai and
                  Ming{-}Dou Ker and
                  Yi{-}Sheng Liu and
                  Ming{-}Nan Chuang},
  title        = {Analysis and solution to overcome {EOS} failure induced by latchup
                  test in a high-voltage integrated circuits},
  booktitle    = {2013 International Symposium on {VLSI} Design, Automation, and Test,
                  {VLSI-DAT} 2013, Hsinchu, Taiwan, April 22-24, 2013},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/VLDI-DAT.2013.6533803},
  doi          = {10.1109/VLDI-DAT.2013.6533803},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi-dat/TsaiKLC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}