BibTeX record conf/vlsi-dat/GoelWAML14

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@inproceedings{DBLP:conf/vlsi-dat/GoelWAML14,
  author       = {Sandeep Kumar Goel and
                  Min{-}Jer Wang and
                  Saman Adham and
                  Ashok Mehta and
                  Frank Lee},
  title        = {Design-for-diagnosis: Your safety net in catching design errors in
                  known good dies in CoWoS\({}^{\mbox{TM}}\)/3D ICs},
  booktitle    = {Technical Papers of 2014 International Symposium on {VLSI} Design,
                  Automation and Test, {VLSI-DAT} 2014, Hsinchu, Taiwan, April 28-30,
                  2014},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/VLSI-DAT.2014.6834918},
  doi          = {10.1109/VLSI-DAT.2014.6834918},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi-dat/GoelWAML14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}