BibTeX record conf/visapp/BarbosaAVFM23

download as .bib file

@inproceedings{DBLP:conf/visapp/BarbosaAVFM23,
  author       = {Warley Barbosa and
                  Lucas Amaral and
                  Tiago F. Vieira and
                  Bruno Georgevich Ferreira and
                  Gustavo Melo},
  editor       = {Petia Radeva and
                  Giovanni Maria Farinella and
                  Kadi Bouatouch},
  title        = {Industrial Visual Defect Inspection of Electronic Components with
                  Siamese Neural Network},
  booktitle    = {Proceedings of the 18th International Joint Conference on Computer
                  Vision, Imaging and Computer Graphics Theory and Applications, {VISIGRAPP}
                  2023, Volume 4: VISAPP, Lisbon, Portugal, February 19-21, 2023},
  pages        = {889--896},
  publisher    = {{SCITEPRESS}},
  year         = {2023},
  url          = {https://doi.org/10.5220/0011696400003417},
  doi          = {10.5220/0011696400003417},
  timestamp    = {Mon, 08 Apr 2024 14:13:40 +0200},
  biburl       = {https://dblp.org/rec/conf/visapp/BarbosaAVFM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.