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BibTeX record conf/vdat/MaityRG17
@inproceedings{DBLP:conf/vdat/MaityRG17, author = {Dilip Kumar Maity and Surajit Kumar Roy and Chandan Giri}, editor = {Brajesh Kumar Kaushik and Sudeb Dasgupta and Virendra Singh}, title = {Faulty TSVs Identification in 3D {IC} Using Pre-bond Testing}, booktitle = {{VLSI} Design and Test - 21st International Symposium, {VDAT} 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers}, series = {Communications in Computer and Information Science}, volume = {711}, pages = {805--812}, publisher = {Springer}, year = {2017}, url = {https://doi.org/10.1007/978-981-10-7470-7\_75}, doi = {10.1007/978-981-10-7470-7\_75}, timestamp = {Sat, 19 Oct 2019 20:28:05 +0200}, biburl = {https://dblp.org/rec/conf/vdat/MaityRG17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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