BibTeX record conf/vdat/0001NPT16

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@inproceedings{DBLP:conf/vdat/0001NPT16,
  author       = {Binod Kumar and
                  Boda Nehru and
                  Brajesh Pandey and
                  Jaynarayan T. Tudu},
  title        = {Skip-scan: {A} methodology for test time reduction},
  booktitle    = {20th International Symposium on {VLSI} Design and Test, {VDAT} 2016,
                  Guwahati, India, May 24-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ISVDAT.2016.8064869},
  doi          = {10.1109/ISVDAT.2016.8064869},
  timestamp    = {Sun, 25 Oct 2020 23:07:10 +0100},
  biburl       = {https://dblp.org/rec/conf/vdat/0001NPT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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