BibTeX record conf/uemcom/CollierLSPBLL23

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@inproceedings{DBLP:conf/uemcom/CollierLSPBLL23,
  author       = {Zachary A. Collier and
                  Davis C. Loose and
                  Elvie Sellers and
                  Thomas L. Polmateer and
                  Madhur Behl and
                  Igor Linkov and
                  James H. Lambert},
  editor       = {Satyajit Chakrabarti and
                  Rajashree Paul},
  title        = {Stress Testing for Resilience of Semiconductor Supply Chains},
  booktitle    = {14th {IEEE} Annual Ubiquitous Computing, Electronics {\&} Mobile
                  Communication Conference, {UEMCON} 2023, New York, NY, USA, October
                  12-14, 2023},
  pages        = {42--49},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/UEMCON59035.2023.10315988},
  doi          = {10.1109/UEMCON59035.2023.10315988},
  timestamp    = {Fri, 24 Nov 2023 20:33:22 +0100},
  biburl       = {https://dblp.org/rec/conf/uemcom/CollierLSPBLL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}