BibTeX record conf/tsa/LeeL15

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@inproceedings{DBLP:conf/tsa/LeeL15,
  author       = {Shou{-}Yu Lee and
                  Yihao Li},
  title        = {{DRS:} {A} Developer Risk Metric for Better Predicting Software Fault-Proneness},
  booktitle    = {2015 Second International Conference on Trustworthy Systems and Their
                  Applications, {TSA} 2015, Hualien, Taiwan, July 8-9, 2015},
  pages        = {120--127},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/TSA.2015.27},
  doi          = {10.1109/TSA.2015.27},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/tsa/LeeL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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