BibTeX record conf/tencon/PhuaT20

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@inproceedings{DBLP:conf/tencon/PhuaT20,
  author       = {Charissa Phua and
                  Lau Bee Theng},
  title        = {Semiconductor Wafer Surface: Automatic Defect Classification with
                  Deep {CNN}},
  booktitle    = {2020 {IEEE} Region 10 Conference, {TENCON} 2020, Osaka, Japan, November
                  16-19, 2020},
  pages        = {714--719},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/TENCON50793.2020.9293715},
  doi          = {10.1109/TENCON50793.2020.9293715},
  timestamp    = {Thu, 14 Oct 2021 10:32:58 +0200},
  biburl       = {https://dblp.org/rec/conf/tencon/PhuaT20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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