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BibTeX record conf/tencon/KanedaAM20
@inproceedings{DBLP:conf/tencon/KanedaAM20, author = {Masanobu Kaneda and Kazuma Ariyoshi and Satoshi Matsumoto}, title = {Comparisons of instability in device characteristics at high temperature for thin-film {SOI} power n- and p- channel MOSFETs}, booktitle = {2020 {IEEE} Region 10 Conference, {TENCON} 2020, Osaka, Japan, November 16-19, 2020}, pages = {134--139}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/TENCON50793.2020.9293695}, doi = {10.1109/TENCON50793.2020.9293695}, timestamp = {Thu, 28 Jan 2021 11:14:25 +0100}, biburl = {https://dblp.org/rec/conf/tencon/KanedaAM20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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