Bernhard K. Aichernig Farhad Arbab Lacramioara Astefanoaei Frank S. de Boer Sun Meng Jan J. M. M. Rutten Fault-Based Test Case Generation for Component Connectors. 147-154 2009 TASE http://dx.doi.org/10.1109/TASE.2009.14 conf/tase/2009 db/conf/tase/tase2009.html#AichernigAAB0R09