BibTeX record conf/ssiri/WuY014

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@inproceedings{DBLP:conf/ssiri/WuY014,
  author       = {Tianyong Wu and
                  Jun Yan and
                  Jian Zhang},
  title        = {Automatic Test Data Generation for Unit Testing to Achieve {MC/DC}
                  Criterion},
  booktitle    = {Eighth International Conference on Software Security and Reliability,
                  {SERE} 2014, San Francisco, California, USA, June 30 - July 2, 2014},
  pages        = {118--126},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/SERE.2014.25},
  doi          = {10.1109/SERE.2014.25},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/ssiri/WuY014.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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