BibTeX record conf/splc/ReulingBRLK15

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@inproceedings{DBLP:conf/splc/ReulingBRLK15,
  author       = {Dennis Reuling and
                  Johannes B{\"{u}}rdek and
                  Serge Rot{\"{a}}rmel and
                  Malte Lochau and
                  Udo Kelter},
  editor       = {Douglas C. Schmidt},
  title        = {Fault-based product-line testing: effective sample generation based
                  on feature-diagram mutation},
  booktitle    = {Proceedings of the 19th International Conference on Software Product
                  Line, {SPLC} 2015, Nashville, TN, USA, July 20-24, 2015},
  pages        = {131--140},
  publisher    = {{ACM}},
  year         = {2015},
  url          = {https://doi.org/10.1145/2791060.2791074},
  doi          = {10.1145/2791060.2791074},
  timestamp    = {Tue, 06 Nov 2018 16:57:31 +0100},
  biburl       = {https://dblp.org/rec/conf/splc/ReulingBRLK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}