Joachim Bayer Sebastien Gerard Øystein Haugen Jason Xabier Mansell Birger Møller-Pedersen Jon Oldevik Patrick Tessier Jean-Philippe Thibault Tanya Widen Consolidated Product Line Variability Modeling. 195-241 2006 conf/splc/2006book Software Product Lines http://dx.doi.org/10.1007/978-3-540-33253-4_6 db/conf/splc/splBook2006.html#BayerGHMMOTTW06