BibTeX record conf/smc/WeberTCF21

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@inproceedings{DBLP:conf/smc/WeberTCF21,
  author       = {Christian Weber and
                  A. Tripuramallu and
                  Peter Czerner and
                  Madjid Fathi},
  title        = {Clustering Wafer Defect Patterns Within the Semiconductor Industry
                  Based on Wafer Maps, Using an Agile Unsupervised Deep Learning Approach},
  booktitle    = {2021 {IEEE} International Conference on Systems, Man, and Cybernetics,
                  {SMC} 2021, Melbourne, Australia, October 17-20, 2021},
  pages        = {1913--1918},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/SMC52423.2021.9658907},
  doi          = {10.1109/SMC52423.2021.9658907},
  timestamp    = {Tue, 08 Aug 2023 12:06:53 +0200},
  biburl       = {https://dblp.org/rec/conf/smc/WeberTCF21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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