BibTeX
@inproceedings{DBLP:conf/smc/SanchezP04,
author = {Ubaldo Aleriano Sanchez and
Tilo Pfeifer},
title = {Optical metrology aimed for process quality-control-loops
(QCL) in production-modules for micro-technology},
booktitle = {SMC (6)},
year = {2004},
pages = {5417-5422},
ee = {http://dx.doi.org/10.1109/ICSMC.2004.1401055},
crossref = {DBLP:conf/smc/2004},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/smc/2004,
title = {Proceedings of the IEEE International Conference on Systems,
Man {\&} Cybernetics: The Hague, Netherlands, 10-13 October
2004},
booktitle = {SMC},
publisher = {IEEE},
year = {2004},
isbn = {0-7803-8566-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2005-11-09 by Michael Ley (ley@uni-trier.de)