BibTeX record conf/smc/AlateeqP17

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@inproceedings{DBLP:conf/smc/AlateeqP17,
  author       = {Majed M. Alateeq and
                  Witold Pedrycz},
  title        = {Analysis of optimization algorithms in automated test pattern generation
                  for sequential circuits},
  booktitle    = {2017 {IEEE} International Conference on Systems, Man, and Cybernetics,
                  {SMC} 2017, Banff, AB, Canada, October 5-8, 2017},
  pages        = {1834--1839},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/SMC.2017.8122883},
  doi          = {10.1109/SMC.2017.8122883},
  timestamp    = {Sat, 19 Oct 2019 20:18:12 +0200},
  biburl       = {https://dblp.org/rec/conf/smc/AlateeqP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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