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BibTeX record conf/smc/0003DL23
@inproceedings{DBLP:conf/smc/0003DL23, author = {Yanyun Wang and Dehui Du and Yuanhao Liu}, title = {Meta Pattern Concern Score: {A} Novel Evaluation Measure with Human Values for Multi-classifiers}, booktitle = {{IEEE} International Conference on Systems, Man, and Cybernetics, {SMC} 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023}, pages = {597--604}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/SMC53992.2023.10394380}, doi = {10.1109/SMC53992.2023.10394380}, timestamp = {Tue, 13 Feb 2024 11:41:04 +0100}, biburl = {https://dblp.org/rec/conf/smc/0003DL23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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