BibTeX record conf/smacd/Ye0C0TT17

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@inproceedings{DBLP:conf/smacd/Ye0C0TT17,
  author       = {Yaoyao Ye and
                  Taeyoung Kim and
                  Hai{-}Bao Chen and
                  Hai Wang and
                  Esteban Tlelo{-}Cuautle and
                  Sheldon X.{-}D. Tan},
  title        = {Comprehensive detection of counterfeit ICs via on-chip sensor and
                  post-fabrication authentication policy},
  booktitle    = {14th International Conference on Synthesis, Modeling, Analysis and
                  Simulation Methods and Applications to Circuit Design, {SMACD} 2017,
                  Giardini Naxos, Italy, June 12-15, 2017},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/SMACD.2017.7981561},
  doi          = {10.1109/SMACD.2017.7981561},
  timestamp    = {Fri, 09 Apr 2021 18:35:29 +0200},
  biburl       = {https://dblp.org/rec/conf/smacd/Ye0C0TT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}