BibTeX record conf/sma2/NguyenSYKKK20

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@inproceedings{DBLP:conf/sma2/NguyenSYKKK20,
  author       = {Huy Toan Nguyen and
                  Nu{-}ri Shin and
                  Gwanghyun Yu and
                  Gyeong{-}Ju Kwon and
                  Woo{-}Young Kwak and
                  Jin{-}Young Kim},
  title        = {Deep learning-based defective product classification system for smart
                  factory},
  booktitle    = {{SMA} 2020: The 9th International Conference on Smart Media and Applications,
                  Jeju, Republic of Korea, September 17 - 19, 2020},
  pages        = {80--85},
  publisher    = {{ACM}},
  year         = {2020},
  url          = {https://doi.org/10.1145/3426020.3426039},
  doi          = {10.1145/3426020.3426039},
  timestamp    = {Thu, 12 May 2022 16:50:25 +0200},
  biburl       = {https://dblp.org/rec/conf/sma2/NguyenSYKKK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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