Impact of interconnect length changes on effective materials properties (dielectric constant).

Mary Yvonne Lanzerotti Giovanni Fiorenza Rick A. Rand Impact of interconnect length changes on effective materials properties (dielectric constant). 73-80 2007 conf/slip/2007 SLIP http://doi.acm.org/10.1145/1231956.1231972 db/conf/slip/slip2007.html#LanzerottiFR07