BibTeX record conf/siu/EryilmazCATTYYG22

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@inproceedings{DBLP:conf/siu/EryilmazCATTYYG22,
  author       = {Mustafa Eryilmaz and
                  Metehan {\c{C}}il and
                  Sedat Akt{\"{u}}rk and
                  Mehmet Tilegi and
                  Hakan Tirak and
                  Atila Yilmaz and
                  Seniha Esen Y{\"{u}}ksel and
                  Din{\c{c}}er G{\"{o}}kcen},
  title        = {Defect Classification from Electronic Card Images by Deep Learning},
  booktitle    = {30th Signal Processing and Communications Applications Conference,
                  {SIU} 2022, Safranbolu, Turkey, May 15-18, 2022},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/SIU55565.2022.9864727},
  doi          = {10.1109/SIU55565.2022.9864727},
  timestamp    = {Wed, 07 Sep 2022 15:03:00 +0200},
  biburl       = {https://dblp.org/rec/conf/siu/EryilmazCATTYYG22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}