BibTeX
@inproceedings{DBLP:conf/sigmetrics/SchmidCFCS08,
author = {Thomas Schmid and
Zainul Charbiwala and
Jonathan Friedman and
Young H. Cho and
Mani B. Srivastava},
title = {Exploiting manufacturing variations for compensating environment-induced
clock drift in time synchronization},
booktitle = {SIGMETRICS},
year = {2008},
pages = {97-108},
ee = {http://doi.acm.org/10.1145/1375457.1375469},
crossref = {DBLP:conf/sigmetrics/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/sigmetrics/2008,
editor = {Zhen Liu and
Vishal Misra and
Prashant J. Shenoy},
title = {Proceedings of the 2008 ACM SIGMETRICS International Conference
on Measurement and Modeling of Computer Systems, SIGMETRICS
2008, Annapolis, MD, USA, June 2-6, 2008},
booktitle = {SIGMETRICS},
publisher = {ACM},
year = {2008},
isbn = {978-1-60558-005-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-06-16 by Michael Ley (ley@uni-trier.de)