BibTeX record conf/sigmetrics/AllmeierG23

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@inproceedings{DBLP:conf/sigmetrics/AllmeierG23,
  author       = {Sebastian Allmeier and
                  Nicolas Gast},
  editor       = {Evgenia Smirni and
                  Konstantin Avrachenkov and
                  Phillipa Gill and
                  Bhuvan Urgaonkar},
  title        = {Bias and Refinement of Multiscale Mean Field Models},
  booktitle    = {Abstract Proceedings of the 2023 {ACM} {SIGMETRICS} International
                  Conference on Measurement and Modeling of Computer Systems, {SIGMETRICS}
                  2023, Orlando, FL, USA, June 19-23, 2023},
  pages        = {29--30},
  publisher    = {{ACM}},
  year         = {2023},
  url          = {https://doi.org/10.1145/3578338.3593527},
  doi          = {10.1145/3578338.3593527},
  timestamp    = {Fri, 07 Jul 2023 23:30:46 +0200},
  biburl       = {https://dblp.org/rec/conf/sigmetrics/AllmeierG23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}