Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada

Derek L. Eager Carey L. Williamson Sem C. Borst John C. S. Lui Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada ACM 2005 db/conf/sigmetrics/sigmetrics2005.html 1-59593-022-1